Eleventh International Symposium
on
Machine Processing
of Remotely Sensed Data

with special emphasis on

Quantifying Global Process:
Models, Sensor Systems, and Analytical Methods

The Laboratory for Applications of Remote Sensing
Purdue University
West Lafayette, Indiana 47907 USA

June 25-27, 1985

Edited by S.K. Mengel and D.B. Morrison

Copyright © 1985
by Purdue Research Foundation, West Lafayette, Indiana 47907. All Rights Reserved.
These papers are provided for personal educational use only,
under permission from Purdue Research Foundation.

CATALOG NUMBERS

IEEE CATALOG NUMBER 1985 CH 2168-3 MPRSD
LIBRARY OF CONGRESS CATALOG NUMBER 85-81262

PREFACE

The theme of the Symposium - Quantifying Global Processes: Models, Sensor Systems, and Analytical Methods represents a re-dedication to the science of remote sensing, a change in emphasis both small and significant. At one level, the technology of remote sensing is well established and widely available; for example, anyone may purchase data, acquired by a satellite-borne sensor (Landsat), showing a synoptic view of a portion of the earth. Robust and accepted analysis techniques, some under development for more than 15 years, are implemented as commercially available hardware and software. Specialized companies will provide that analysis in a timely manner and competitively priced.

Yet a feeling exists that we do not know well the tool that is remote sensing. Its ultimate potential is not always obvious because too often we don't have knowledge of the science accompanying it. Papers in this symposium address this issue from two perspectives.

First, remote sensing is considered from an external perspective, as a unitized tool providing an alternate source of information of critically important problem areas. Some of these papers consider what this multidisciplinary tool might tell us about processes on the earth at not only the local and regional scales, but at the global scale. Using remote sensing techniques, can we gain better understanding of the causes and impact of acid precipitation on the environment of the world? How can these techniques better estimate the biological condition of vegetation or estimate environmental fluxes of elements and molecules and their influence on climate?

Secondly, from an internal perspective, the science in remote sensing techniques is addressed. These papers examine, for example, the linkage between remote sensing data and geographic information systems (GIS), the development of new state-of-the-art sensors and techniques for analysis of their data, and strategies for employing data from multiple sensors.

The breadth and diversity of the presentations is noteworthy. The remote sensing community is growing, actively enrolling more disciplines and addressing a wideninq range of issues.

Keith R. Carver, Co-Chairman
Vern Vanderbilt, Co-Chairman

SYMPOSIUM CHAIRMEN

Keith R. Carver

Dr. Keith R. Carver received his B.S. in EE from the University of Kentucky in 1962, then received his M.S. nd PhD. in EE from Ohio State University in 1963 and 1967 respectively. He was a member of the faculty at the University of Kentucky from 1967 to 1969. From 1969 to 1984 he was on the faculty of electrical engineering at New Mexico State University in Las Cruces.

From 1981 to 1982 Dr. Carver was on leave at NASA Headquarters where he was the microwave remote sensing program manager. From 1982 to 1984 he was the Director of the Engineering Research Center at New Mexico State University. In 1984 he accepted the position of Head of the Electrical and Computer engineering department at the University of Massachusetts.

Professor Carver has published extensively in microwave antenna engineering and microwave remote sensing. He was the recipient of the NASA Public Service award in 1983, the IEEE Centennial Medal in 1984, and distinguished service award of IEEE Geoscience and Remote Sensing Society in 1984. He is past President of the IEEE Geoscience and Remote Sensing Society. Currently Dr. Carver is Chairman of the SIR-C Science Working Group and the NASA EOS SAR pane1.

Vern C. Vanderbilt

Dr. Vanderbilt was born in Toledo, Ohio on February 23, 1946. He received the B.S., M.S., and Ph.D. degrees in Electrical Engineering from Purdue University, West Lafayette, Indiana in 1968, 1971, and 1976, respectively.

From 1977 to 1979, he was a post-doctoral fellow at the Purdue University Laboratory for Applications of Remote Sensing (LARS). He is currently a research engineer with LARS measuring and modeling the optical properties of both leaves and plant canopies. He is a member of IEEE, ASP, and Sigma Xi.

SPONSORSHIP

Cosponsors:
     American Society of Agronomy
     Crop Science Society of America
     Institute of Electrical And Electronics Engineers --
            Geoscience and Remote Sensing Society
     Society of American Foresters
     Soil Science Society of America

In Cooperation with:
     American Society of Photogrammetry
     National Aeronautics And Space Administration
     National Oceanic And Atmospheric Administration
     U.S. Department of Agriculture

SYMPOSIUM PROGRAM COMMITTEE

Keith R. Carver, Co-Chairman
Vern C. Vanderbilt, Co-Chairman
Paul E. Anuta
Luis A. Bartolucci
Marion F. Baumgardner
Larry L. Biehl
Craig S. T. Daughtry
Roger M. Hoffer
Stevan Kristof
David Landgrebe
Douglas B. Morrison
Terry L. Phillips
Jon Ransom

SESSION CHAIRS

Ralph Bernstein
Frederic Billingsley
Ernestine Cary
Keith R. Carver
Joseph Cihlar
David G. Goodenough
Daniel Held
Anne B. Kahle
Edward T. Kanemasu
Kamiesh Lulla
Berrien Moore, III
David L. Peterson
Vincent Salomonson

Other symposium proceedings pages not included in the papers below.

TABLE OF CONTENTS